Th. Glatzel: search on Z-Library

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1

Kelvin probe force microscopy of semiconductor surface defects

Rosenwaks, Y., Shikler, R., Glatzel, Th., Sadewasser, S.

Journal:

Physical Review B

Year:

2004

Language:

english

File:

PDF, 475 KB

english, 2004

2

Lift-off process and rear-side characterization of CuGaSe[sub 2] chalcopyrite thin films and solar cells

Fuertes MarroÌn, D., Meeder, A., Sadewasser, S., WuÌrz, R., Kaufmann, C. A., Glatzel, Th., Schedel-Niedrig, Th., Lux-Steiner, M. Ch.

Journal:

Journal of Applied Physics

Year:

2005

Language:

english

File:

PDF, 755 KB

english, 2005

3

Contacting self-ordered molecular wires by nanostencil lithography

Gross, L., Schlittler, R. R., Meyer, G., Fendt, L.-A., Diederich, F., Glatzel, Th., Kawai, S., Koch, S., Meyer, E.

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Year:

2010

Language:

english

File:

PDF, 770 KB

english, 2010

4

Bilayer growth in a metallic system: Fe on Cu(100)

H. Glatzel, Th. Fauster, B.M.U. Scherzer, V. Dose

Journal:

Surface Science Letters

Year:

1991

Language:

english

File:

PDF, 55 KB

english, 1991

5

Interface engineering in chalcopyrite thin film solar devices

Ch.-H. Fischer, M. Bär, Th. Glatzel, I. Lauermann, M.C. Lux-Steiner

Journal:

Solar Energy Materials and Solar Cells

Year:

2006

Language:

english

File:

PDF, 487 KB

english, 2006

6

Amplitude or frequency modulation-detection in Kelvin probe force microscopy

Th Glatzel, S Sadewasser, M.Ch Lux-Steiner

Journal:

Applied Surface Science

Year:

2003

Language:

english

File:

PDF, 189 KB

english, 2003

7

Resolution of Kelvin probe force microscopy in ultrahigh vacuum: comparison of experiment and simulation

S. Sadewasser, Th. Glatzel, R. Shikler, Y. Rosenwaks, M.Ch. Lux-Steiner

Journal:

Applied Surface Science

Year:

2003

Language:

english

File:

PDF, 167 KB

english, 2003

8

Kelvin probe force microscopy in ultra high vacuum using amplitude modulation detection of the electrostatic forces

Ch Sommerhalter, Th Glatzel, Th.W Matthes, A Jäger-Waldau, M.Ch Lux-Steiner

Journal:

Applied Surface Science

Year:

2000

Language:

english

File:

PDF, 227 KB

english, 2000

9

Kelvin probe force microscopy on III–V semiconductors: the effect of surface defects on the local work function

Th. Glatzel, S. Sadewasser, R. Shikler, Y. Rosenwaks, M.Ch. Lux-Steiner

Journal:

Materials Science and Engineering: B

Year:

2003

Language:

english

File:

PDF, 284 KB

english, 2003

10

Potential distribution of Cu(In,Ga)(S,Se)2-solar cell cross-sections measured by Kelvin probe force microscopy

Th. Glatzel, H. Steigert, S. Sadewasser, R. Klenk, M.Ch. Lux-Steiner

Journal:

Thin Solid Films

Year:

2005

Language:

english

File:

PDF, 307 KB

english, 2005

11

High-sensitivity quantitative Kelvin probe microscopy by noncontact ultra-high-vacuum atomic force microscopy

Sommerhalter, Ch., Matthes, Th. W., Glatzel, Th., Jager-Waldau, A., Lux-Steiner, M. Ch.

Journal:

Applied Physics Letters

Year:

1999

Language:

english

File:

PDF, 609 KB

english, 1999

12

Zeitschriften

F. Bahner, W. Müller, E. Grafe, Th. Vaternahm, H. Glatzel, Schroeder, Krainick

Journal:

Journal of Molecular Medicine

Year:

1951

File:

PDF, 684 KB

1951

13

Referatenteil

Christian, Th. Vaternahm, Hamperl, Heilmeyer, Druckrey, Lehnartz, Oehme, Unholtz, Loewenberg, H. Jahrmärker, Weyer, Kleinfelder, Beckmann, Ungeheuer, W. Schöndube, Glatzel, Roland Gädeke, Zierz, Thele

Journal:

Journal of Molecular Medicine

Year:

1952

Language:

german

File:

PDF, 2.12 MB

german, 1952

14

Buchbesprechungen

Th. Vaternahm, R. Gaupp, Kohlrausch, Norpoth, H. Glatzel

Journal:

Journal of Molecular Medicine

Year:

1939

Language:

german

File:

PDF, 756 KB

german, 1939

15

Buchbesprechungen

Lendle, H. Rein, Friedrich Brock, C. Kaufmann, Rieder, H. Kämmerer, Edens, Th. Vaternahm, Fr. Hüsselrath, Bodechtel, Gaupp, Wolfgang Heubner, H. Glatzel, Klose

Journal:

Journal of Molecular Medicine

Year:

1938

Language:

german

File:

PDF, 800 KB

german, 1938

16

Contribution of the ZnSe/CuGaSe2 heterojunction in photovoltaic performances of chalcopyrite-based solar cells

M Rusu, S Sadewasser, Th Glatzel, P Gashin, A Simashkevich, A Jäger-Waldau

Journal:

Thin Solid Films

Year:

2002

Language:

english

File:

PDF, 552 KB

english, 2002

17

Kelvin probe force microscopy for the nano scale characterization of chalcopyrite solar cell materials and devices

S. Sadewasser, Th. Glatzel, S. Schuler, S. Nishiwaki, R. Kaigawa, M.Ch. Lux-Steiner

Journal:

Thin Solid Films

Year:

2003

Language:

english

File:

PDF, 725 KB

english, 2003

18

Kelvin probe force microscopy for the characterization of semiconductor surfaces in chalcopyrite solar cells

Ch. Sommerhalter, S. Sadewasser, Th. Glatzel, Th.W. Matthes, A. Jäger-Waldau, M.Ch. Lux-Steiner

Journal:

Surface Science

Year:

2001

Language:

english

File:

PDF, 338 KB

english, 2001

19

Nanoscale potential distribution across multiquantum well structures: Kelvin probe force microscopy and secondary electron imaging

Schwarzman, A., Grunbaum, E., Strassburg, E., Lepkifker, E., Boag, A., Rosenwaks, Y., Glatzel, Th., Barkay, Z., Mazzer, M., Barnham, K.

Journal:

Journal of Applied Physics

Year:

2005

Language:

english

File:

PDF, 609 KB

english, 2005

20

High-resolution work function imaging of single grains of semiconductor surfaces

Sadewasser, S., Glatzel, Th., Rusu, M., Jager-Waldau, A., Lux-Steiner, M. Ch.

Journal:

Applied Physics Letters

Year:

2002

Language:

english

File:

PDF, 394 KB

english, 2002

21

Bilayer growth in a metallic system: Fe on Cu(100)

H. Glatzel, Th. Fauster, B.M.U. Scherzer, V. Dose

Journal:

Surface Science

Year:

1991

Language:

english

File:

PDF, 793 KB

english, 1991

22

Determination of effective tip geometries in Kelvin probe force microscopy on thin insulating films on metals

Glatzel, Th, Zimmerli, L, Koch, S, Such, B, Kawai, S, Meyer, E

Journal:

Year:

2009

Language:

english

File:

PDF, 954 KB

english, 2009

23

Hydrogen-induced buckling of gold films

Eren, B, Marot, L, Günzburger, G, Renault, P-O, Glatzel, Th, Steiner, R, Meyer, E

Journal:

Journal of Physics D Applied Physics

Year:

2014

Language:

english

File:

PDF, 900 KB

english, 2014

24

Formation of the physical vapor deposited CdS∕Cu(In,Ga)Se[sub 2] interface in highly efficient thin film solar cells

Rusu, M., Glatzel, Th., Neisser, A., Kaufmann, C. A., Sadewasser, S., Lux-Steiner, M. Ch.

Journal:

Applied Physics Letters

Year:

2006

Language:

english

File:

PDF, 304 KB

english, 2006

25

Contrast inversion of the h-BN nanomesh investigated by nc-AFM and Kelvin probe force microscopy

Koch, S, Langer, M, Kawai, S, Meyer, E, Glatzel, Th

Journal:

Journal of Physics Condensed Matter

Year:

2012

Language:

english

File:

PDF, 2.60 MB

english, 2012

26

thin films

Fuertes Marrón, D., Sadewasser, S., Meeder, A., Glatzel, Th., Lux-Steiner, M. Ch.

Journal:

Physical Review B

Year:

2005

Language:

english

File:

PDF, 169 KB

english, 2005

27

Comment on “Electrostatic Force Microscopy on Oriented Graphite Surfaces: Coexistence of Insulating and Conducting Behaviors”

Sadewasser, S., Glatzel, Th.

Journal:

Physical Review Letters

Year:

2007

Language:

english

File:

PDF, 39 KB

english, 2007

28

CuGaSe[sub 2] solar cell cross section studied by Kelvin probe force microscopy in ultrahigh vacuum

Glatzel, Th., Marrón, D. Fuertes, Schedel-Niedrig, Th., Sadewasser, S., Lux-Steiner, M. Ch.

Journal:

Applied Physics Letters

Year:

2002

Language:

english

File:

PDF, 339 KB

english, 2002

29

Asymmetry in the reciprocal epitaxy of NaCl and KBr

Maier, S., Pfeiffer, O., Glatzel, Th., Meyer, E., Filleter, T., Bennewitz, R.

Journal:

Physical Review B

Year:

2007

Language:

english

File:

PDF, 604 KB

english, 2007

30

Cutting and self-healing molecular wires studied by dynamic force microscopy

Kawai, S., Maier, S., Glatzel, Th., Koch, S., Such, B., Zimmerli, L., Fendt, L.-A., Diederich, F., Meyer, E.

Journal:

Applied Physics Letters

Year:

2009

Language:

english

File:

PDF, 514 KB

english, 2009

31

Characterization of quantum wells by cross-sectional Kelvin probe force microscopy

Douhéret, O., Anand, S., Glatzel, Th., Maknys, K., Sadewasser, S.

Journal:

Applied Physics Letters

Year:

2004

Language:

english

File:

PDF, 347 KB

english, 2004

32

Molecular assemblies grown between metallic contacts on insulating surfaces

Glatzel, Th., Zimmerli, L., Koch, S., Kawai, S., Meyer, E.

Journal:

Applied Physics Letters

Year:

2009

Language:

english

File:

PDF, 461 KB

english, 2009

33

Electronic structure of secondary phases in Cu-rich CuGaSe[sub 2] solar cell devices

Fuertes Marrón, D., Glatzel, Th., Meeder, A., Schedel-Niedrig, Th., Sadewasser, S., Lux-Steiner, M. Ch.

Journal:

Applied Physics Letters

Year:

2004

Language:

english

File:

PDF, 451 KB

english, 2004

34

Development of Advanced Tools for Economic and Ecological Grinding of Granite

Denkena, Berend, Tönshoff, Hans Kurt, Friemuth, T., Glatzel, Th.

Journal:

Key Engineering Materials

Year:

2003

Language:

english

File:

PDF, 5.42 MB

english, 2003

35

Characterization of nanoparticles using Atomic Force Microscopy

Rao, A, Schoenenberger, M, Gnecco, E, Glatzel, Th, Meyer, E, Brändlin, D, Scandella, L

Journal:

Journal of Physics Conference Series

Year:

2007

Language:

english

File:

PDF, 1.16 MB

english, 2007

36

Surface photovoltage analysis of thin CdS layers on polycrystalline chalcopyrite absorber layers by Kelvin probe force microscopy

Glatzel, Th, Rusu, M, Sadewasser, S, Lux-Steiner, M Ch

Journal:

Year:

2008

Language:

english

File:

PDF, 1.02 MB

english, 2008

37

Electronic Surface Properties of Ultrahigh Vacuum Grown Polycrystalline CuGaSe2

Sadewasser, S., Ishii, K., Glatzel, Th., Lux-Steiner, M.Ch.

Journal:

Solid State Phenomena

Year:

2003

File:

PDF, 554 KB

2003

38

Characterization of the CuGaSe2/ZnSe Interface Using Kelvin Probe Force Microscopy

Sadewasser, S., Glatzel, Th., Rusu, M., Meeder, A., Fuertes Marrón, D., Jäger-Waldau, A., Lux-Steiner, M.Ch.

Journal:

MRS Proceedings

Year:

2001

Language:

english

File:

PDF, 523 KB

english, 2001

39

Dopant imaging of power semiconductor device cross sections

Gysin, U., Meyer, E., Glatzel, Th., Günzburger, G., Rossmann, H.R., Jung, T.A., Reshanov, S., Schöner, A., Bartolf, H.

Journal:

Microelectronic Engineering

Year:

2016

Language:

english

File:

PDF, 638 KB

english, 2016

40

Formation of molecular wires on nanostructured KBr

Zimmerli, L, Maier, S, Glatzel, Th, Gnecco, E, Pfeiffer, O, Diederich, F, Fendt, L, Meyer, E

Journal:

Journal of Physics Conference Series

Year:

2007

Language:

english

File:

PDF, 459 KB

english, 2007

41

Work function of few layer graphene covered nickel thin films measured with Kelvin probe force microscopy

Eren, B., Gysin, U., Marot, L., Glatzel, Th., Steiner, R., Meyer, E.

Journal:

Applied Physics Letters

Year:

2016

Language:

english

File:

PDF, 1.17 MB

english, 2016